| Specification | Test Bench | ATE (Tester) |
| DUT Count(s) | 1 DUT | 2~8 DUTs |
| Size (cm) | 73 (w) x 85 (D) x 89(H) | Customize |
| Static measurement (DC) | 3500V /2000A | |
| Dynamic measurement (AC) | Switching time test (3500V /2000A) | |
| Short circuit test (2000A) | ||
| Double pulse test (3500V / 2000A) | ||
| Thermal resistance test (FB) | DVDS Test (400V/200A) | |
| Interface | NA | Load Board/Probe Card |
| Support | NA | Handler/Prober |
The XTK-006 WBG Test Bench delivers precise, reliable testing for wide bandgap devices. Ideal for SiC and GaN semiconductor characterization
