Dimension : W 730 x D 850 x H 890mm (Inc. roller)
System : Main Board (Inc Monitor, Keyboard, Mouse)
Static measurement (DC) : Voltage : 3500V, Current : 2000A
Dynamic measurement (AC) : Switching time test (3500V /2000A), Short circuit test (2000A), Double pulse test (3500V / 2000A)
Optional Test Module
Thermal resistance test (FB) : DVDS Test (400V/200A)
Unclamped Inductive Switching (UIS) : 3000V /200A
XTK-007 D-HTOL TESTER – Advanced XTK-007 D-HTOL Tester for dynamic high-temperature operating life (HTOL) testing. Designed for SiC, GaN, and semiconductor reliability qualification.
Dimension : W 730 x D 850 x H 890mm (Inc. roller)
System : Main Board (Inc Monitor, Keyboard, Mouse)
Static measurement (DC) : Voltage : 3500V, Current : 2000A
Dynamic measurement (AC) : Switching time test (3500V /2000A), Short circuit test (2000A), Double pulse test (3500V / 2000A)
Optional Test Module
Thermal resistance test (FB) : DVDS Test (400V/200A)
Unclamped Inductive Switching (UIS) : 3000V /200A
